The C8000-30 employs an ultrahigh-sensitivity back-thinned CCD sensor made by Hamamatsu, which offers extremely high quantum efficiency in a wide range of UV, VIS and NIR wavelengths. The high UV sensitivity from 120 nm is useful for semiconductor mask inspection and measurement applications. Also, the high NIR sensitivity is useful for fluorescence measurement, NIR LD measurement and so on.
Type number | C8000-30 |
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Imaging device | Back-thinned frame transfer CCD |
Effective no. of pixels | 640 (H)×480 (V) |
Cell size | 14 μm (H)×14 μm (V) |
Effective area | 8.96 mm (H)×6.72 mm (V) |
Full well capacity | 30 000 electrons (typ.) |
Readout speed | 31.4 frames/s |
Readout noise | 150 electrons (rms) (typ.) |
Exposure time | 30.8 ms to 1 s |
Cooling method | Passive air-cooled |
Cooling temperature | +5 ℃ (room temperature +20 ℃) |
Analog gain | Approx. 1 to 5 times (16 steps) |
Sub-array | 8 pixels increments (V) |
Camera control | CameraLink |
External trigger mode | Edge trigger, Level trigger, Start trigger, Synchronous readout trigger |
Image processing functions | Background subtraction, Recursive filter |
Interface | CameraLink Base Configuration |
A/D converter | 12 bit |
Lens mount | C-mount |
Power supply | DC+12 V |
Power consumption | approx. 10 VA |
Ambient operating temperature | 0 ℃ to +40 ℃ |
Performance guaranteed temperature | 0 ℃ to +30 ℃ |
Ambient storage temperature | -10 ℃ to +50 ℃ |
Ambient operating humidity | 70 % max. (with no condensation) |
Ambient storage humidity | 90 % max. (with no condensation) |
Readout speed
Binning | 1×1 | 2×2 | 4×4 |
Readout speed (frames/s) | 31.4 | 58.3 | 101.8 |
型號 | 概述 | 詢價數量 |
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